Used VEECO / SLOAN DEKTAK 3030 #293830701 for sale

VEECO / SLOAN DEKTAK 3030
ID: 293830701
Wafer Size: 6"-8"
Surface profiler, 6"-8".
VEECO / SLOAN DEKTAK 3030 is a high precision surface profilometer equipment designed to measure the topographical characteristics of a wide variety of surfaces. It measures up to 400 micrometer depth which allows for the detailed analysis of features and electrical characteristics on wafers used in semiconductor and optical device manufacturing. The system utilizes an air bearing stylus radial scanning mechanism to provide a non-contact approach that does not damage or change the surface that is being measured. It is designed to provide extremely accurate surface profile measurements with a resolution of 0.5 Ångstroms to 400 micrometers, allowing for even the minuscule imperfections to be detected. The unit is highly automated with a very intuitive user interface that is easy to learn and use. It also comes with integrated software for data acquisition and display which allows for real-time visualization of measurements. VEECO DEKTAK 3030 also includes powerful analytical tools to quickly identify and isolate features and malfunctions found on the wafer. It also can capture surface images which can be used to analyze and identify defects such as debris, particles, and other abnormally raised or lowered surfaces. SLOAN DEKTAK 3030 can measure various parameters including surface texture, surface morphology, film thickness, step heights, flatness, resistivity profile, and more. It is durable and reliable and can be used in production, research, and quality control environments. The machine offers a modular platform that allows for custom configurations to meet specific requirements. DEKTAK 3030 is one of the most advanced wafer testing and metrology systems on the market. It has been designed to provide manufacturers with highly accurate measurements to help them achieve the highest level of process performance. The tool's automated functions help streamline the testing process, allowing for quicker analysis and faster production. This wafer testing and metrology asset is an essential tool for anyone needing to perform accurate surface measurements.
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