Used VEECO / SLOAN DEKTAK 3030 #9193065 for sale

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ID: 9193065
Vintage: 1987
Profilometer Chuck: 6" 1987 vintage.
VEECO / SLOAN DEKTAK 3030 is an advanced wafer testing and metrology equipment that is designed to offer optimal performance and accuracy. This system is capable of measuring a wide range of surface and subsurface characteristics of semiconductor wafers. It comes equipped with a powerful optical unit that makes use of digital imaging and interferometry for quick and accurate measurements. VEECO DEKTAK 3030 machine features a long working command-coordinate that comprises of a scan arm, a robust metrology head and an X-Y translation stage. The scan arm allows for direct access to the sample wafer, which enables detailed surface measurements even on the smaller wafers. The metrology head is also enabled with a long range of Z-height capabilities to get detailed subsurface measurements. This tool also has a high accuracy, repeatability, and stability to ensure high-quality measurements. The opto-mechanical asset of SLOAN DEKTAK 3030 is comprised of two state-of-the-art optical components that include a 10 mW NxProbe He-Ne laser interferometer and a digital microscope. The laser interferometer yields high-resolution vertical measurements and provides accurate in-plane measurements. On the other hand, the digital microscope optimizes various processes related to the imaging and metrology tasks such as high-resolution imaging and texture analysis. The software suite that comes with the model helps in controlling the metrology head, the XY stage, and the components of the equipment. It provides a user-friendly and intuitive graphical user interface that enables users to control the instrument from anywhere and also streamlines the data acquisition process. The system can directly output data in an easy-to-read format for further analysis and data interpretation of the results. Overall, DEKTAK 3030 is an ideal solution for any applications that require precise analysis and metrology of wafer surfaces and properties. It has features such as long working command-coordinate and opto-mechanical unit for highly accurate measurements. It also has a powerful software suite that facilitates result acquisition and evaluation. This machine provides optimum performance and accuracy for efficient and reliable measurements.
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