Used VEECO / SLOAN DEKTAK 3030 #9247712 for sale

ID: 9247712
Surface profiler.
VEECO / SLOAN DEKTAK 3030 is a versatile, advanced wafer testing and metrology equipment designed to meet the needs of the semiconductor industry. It is ideal for research and characterization of wafers, MEMS devices, and various other technologies. VEECO DEKTAK 3030 enables wafer testing and metrology through a combination of multiple surface imaging, surface scanning, and depth sensing, utilizing advanced algorithms to achieve optimal accuracy. It offers 3D topography, 3D surface scanning, and creep force measurements for scanning probe microscopy (SPM) applications. The system utilizes a variable wavelength optical profilometer to achieve high-resolution images of wafers, with a maximum step height of 2 microns and a depth resolution of 0.5 nanometers. The peak to valley accuracy is 1 nanometer while the lateral resolution is 0.2 microns. Additionally, SLOAN DEKTAK 3030 can accommodate up to four wafers for testing and simultaneous imaging. DEKTAK 3030 features a 5-axis stage capable of scanning wafers with up to 5 mm of vertical clearance and horizontal resolution of 0.15 nanometer. The sample stage can also handle different sample sizes during single testing runs. VEECO / SLOAN DEKTAK 3030 also features advanced imaging software that is highly customizable to meet the specific requirements of a variety of applications. The software provides comprehensive image processing capabilities and can be set to automatically report results according to user-defined criteria. This enables comparative analysis between different images and helps pinpoint flaws and defects. The unit also features specialized scanning force microscopy (SFM) probes which can measure a wide range of force including contact, cantilever, and creep forces. This allows characterization of material properties at a nanometer level. The machine is equipped with software for analysis of cantilever force versus displacement curves, which allows for direct measurement of material properties such as Young's Modulus and hardness. VEECO DEKTAK 3030 tool is a powerful tool for the semiconductor industry that can provide detailed investigation of a wide range of materials and surface profiles. It offers advanced imaging capabilities and analysis of material properties to assist in the development and characterization of wafers, MEMS devices, and other technologies.
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