Used VEECO / SLOAN DEKTAK 3ST #9132980 for sale

VEECO / SLOAN DEKTAK 3ST is an ultra-precision, non-contact wafer testing equipment designed for scanning and testing semiconductor wafers. Its focused on delivering accurate, repeatable measurements for wafer dimensions and surface profiles. The system incorporates advanced optical and metrology technologies for testing a variety of semiconductor wafers, including plain or patterned substrates. VEECO DEKTAK 3ST is designed for quality control and production metrology operations. It is equipped with a high-speed, 3-axis sample stage for fast scanning and a unique scanning laser head that can move the sample horizontally along the Z-axis in a unique swing path without the need for pitch or focus adjustments. This allows the unit to deliver accurate measurements from sample to sample, even when the surface patterns vary. The machine's advanced optical and metrology engines allow for well-defined measurement pathways that minimize errors and guarantee the most accurate data. SLOAN DEKTAK 3 ST is equipped with advanced algorithms for complex 2D shape recognition, for analyzing 2D shapes and complex substrate features. It features powerful analysis and reporting capabilities, enabling the user to examine large datasets and measure critical process parameters. The tool's automated reporting tool allows for quicker pass/fail decisions, enabling users to quickly identify discrepant parts. Additionally, data can easily be exported to a variety of formats for further analysis. VEECO DEKTAK 3 ST asset is easy to setup and operate, with a friendly, intuitive user interface. It features automated workflow for setting up the measurement parameters for repeatability. It also includes a selection of software tools to facilitate setup and operation. It is compatible with a variety of programming languages, including LabVIEW, VisualBasci, and Python. Furthermore, VEECO / SLOAN DEKTAK 3 ST is compliant with various quality standards, including SEMI, JEDEC, and MIL-S-8808. DEKTAK 3 ST is perfect for quality control operations and production metrology, providing highly accurate dimensional and surface profile measurements for wafers. In addition to its sophisticated optical and metrology systems, it also offers automated data analysis and reporting features, ease of setup and operation, and compliance with various quality standards. This makes SLOAN DEKTAK 3ST a very powerful and useful wafer testing and metrology model.