Used VEECO / SLOAN DEKTAK 3ST #9210179 for sale

ID: 9210179
Vintage: 2001
Wafer surface profiler 2001 vintage.
VEECO / SLOAN DEKTAK 3ST is a fully automated, precise, and reliable wafer inspection and metrology equipment for the semiconductor industry. VEECO DEKTAK 3ST offers precision at a variety of stages, from basic inspection through advanced profiling. It is a direct-drive and low-pressure wafer testing machine with robust accuracy and repeatability. The machine is used for inspections of the surface and topography of wafers. It is equipped with a simple two-axis optical system that uses a laser interferometer for measuring height, thickness, and other characteristics of delicate wafers. The unit provides a range of features, such as non-contact surface profilometry, scanning electron microscopy (SEM), particle imaging velocimetry (PIV), and eddy current inspection (ECI). SLOAN DEKTAK 3 ST is also capable of imaging directly onto the wafer surface. SLOAN DEKTAK 3ST's advanced profilometry and scanning capabilities make it the ideal machine for surface analysis. Using an integrated vision tool, the machine captures nanometer-level information of the wafer's surface and processes it into data points. It then applies various mathematical algorithms to map the wafer's characteristics and generate 3D models with stunning Real Time 3D Imaging (RT3D) simulations, full reports, and formats that can be easily shared or imported into CAD tools, process control systems, and analysis systems. VEECO DEKTAK 3 ST is equipped with low-pressure surface profilometry attachments, which makes it ideal for high-throughput inspections and analysis. The low-pressure capability ensures a broad range of accuracy and repeatability when measuring delicate wafers. This important offer makes VEECO / SLOAN DEKTAK 3 ST the ideal choice for nanometer-level surface metrology and inspection. In conclusion, DEKTAK 3 ST is an advanced wafer testing and metrology asset that is optimized for accuracy, repeatability, and throughput. The machine is capable of capturing surface and topographical characteristics with nanometer-level accuracy, and its low-pressure profiling feature offers great accuracy for delicate wafers. With a full suite of profilometry and data-gathering tools, DEKTAK 3ST is the ideal model for advanced surface analysis.
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