Used VEECO / SLOAN DEKTAK 3ST #9351652 for sale

VEECO / SLOAN DEKTAK 3ST is a benchtop wafer testing and metrology system. It is a versatile, high-precision instrument designed to measure a wide variety of semiconductor parameters during wafer fabrication. The 3ST is commonly used for critical sampling and statistical analysis of wafers. The instrument features integrated wafer handling and automated cassette-to-cassette transporters, enabling fast and precise wafer testing, characterization, and metrology processes. The 3ST is also equipped with an intuitive graphical interface, allowing for easy navigation of the instrument, as well as access to real-time test results and data visualizations. The 3ST employs a patented "vertical surface profiler" for precision wafer surface scanning. This high-speed, high-accuracy scanner operates at a wavelength of 10 μm and offers scanning speeds of up to 500 μm/s. The scanning head is capable of collecting thousands of data points with high resolution, allowing users to capture fine details of any wafer surface across a wide range of scales. The 3ST's proprietary metrology software provides comprehensive results analysis, allowing users to identify non-conforming wafers quickly and accurately. Its advanced filtering and binning capabilities also offer users the flexibility to adjust for noise and interference to analyze true results. The 3ST is capable of performing many types of wafer measurements, such as profile, roughness, surface height, thickness, defect and contamination, webcast, hole size, hole shape, and more. The system can also be operated in temperature-controlled, humidity-controlled, and/or vibration-isolated environment to ensure accurate results. Overall, VEECO DEKTAK 3ST is an advanced, easy-to-use wafer testing and metrology system that provides highly accurate results, giving users the confidence they need to produce high-quality semiconductors.