Used VEECO / SLOAN DEKTAK 3ST #9378636 for sale

VEECO / SLOAN DEKTAK 3ST wafer testing and metrology equipment is a high-precision surface profiler constructed for handling and testing a variety of wafer specimens from various semiconductor processes. This system features an innovative design to facilitate the testing of various crystalline structures, including silicon, polysilicon, epitaxial materials, nitrides, oxides, and other semiconductor materials. The design incorporates an advanced sensing head for monitoring and responding to the surface profile of a wafer that moves across the unit. VEECO DEKTAK 3ST is an articulated mechanical machine which includes an aluminum-frame support gantry that houses the sensors, moving arms, electronics, and other support elements. The gantry is positioned over a quartz weighing cradle, which is mounted on a stainless steel frame. The base frame also supports a motor actuator. This motor is responsible for moving the aluminum gantry via sliding rails across the quartz bath. The kit provides a multi-axis controller, which allows the user to adjust the position of the gantry, the sensitivity of the sensing head, and the speed of the sensor head to accurately measure the surface profile of different types of wafers. The instrument also comes with a variety of software applications, allowing users to analyze their data, calibrate the instrument, and store profile data. The design also features a powerful software suite for automated data acquisition and analysis. This software suite allows users to store and compare wafer profiles, create three-dimensional (3D) models, analyze data, and apply various statistical models to their data. The tool also includes a separate control panel, which allows the user to quickly adjust various asset settings, such as the speed of the scanning head, peak detection level, and even zoom-in features. The advanced sensor head utilized by SLOAN DEKTAK 3 ST is capable of delivering extremely precise, multiple-site measurements of a wide range of wafer surfaces. The sensor utilizes a combination of optical and interferometric technology to accurately measure the surface profile of any given wafer. The model is able to capture a single plate of data with a resolution of 1 to 6 micrometers. DEKTAK 3 ST also provides full wafer mapping capability, enabling users to check each site within the wafer for uniformity and defects. DEKTAK 3ST equipment is a versatile and highly accurate surface profiler for measuring a variety of wafer surfaces. The instrument features a range of features such as an advanced sensing head, automated data acquisition, and powerful software suite to enable users to measure, analyze, and store the surface profile of their targeted wafers. With these tools, users can accurately measure the surface profile of their wafers and create detailed, high-resolution 3D models of their wafer surfaces.