Used VEECO / SLOAN DEKTAK 6M #293633019 for sale
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ID: 293633019
Surface profiler
Stylus: 2.5 µm
Environmental enclosure
PC with accessories
Manual
Power supply.
VEECO / SLOAN DEKTAK 6M is a wafer testing and metrology equipment designed to measure the surface characteristics of semiconductor wafers with accuracy and speed. It is widely used in the semiconductor industry to assess the quality of fabricated devices. The system consists of a five-axis stage which can move with three degrees of freedom. The stage is capable of moving wafers up to 6 inches in diameter and transporting them between various measurement probes and stages of the unit. The machine also features advanced motor control and positioning systems for consistent and repeatable motion and for precise control of the motion of the wafer. VEECO DEKTAK 6M is equipped with advanced optical and scanning probe technologies for rapid and accurate testing. The tool utilises laser interferometers to make non-contact surface height measurements of the wafer with accuracy to within a few nanometers. The asset can also be outfitted with scanning probes for making electrical measurements and for testing for shorts and opens. The model includes powerful software for controlling the operation of the equipment and for making, recording and analysing measurements. It allows for a wide range of customisable test recipes and data analysis options, including trend analysis and alarms. SLOAN DEKTAK 6M has been designed with an ergonomic user interface that allows users to control the system quickly and intuitively. The unit features a wide range of safety features to ensure user safety. Overall, DEKTAK 6M is a highly advanced wafer testing and metrology machine designed to provide fast and accurate measurements of the surface characteristics of semiconductor wafers. The tool is widely used in the semiconductor industry and its powerful and intuitive user interface, advanced motor control and positioning systems, and powerful software make it an invaluable tool for quality control and process monitoring.
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