Used VEECO / SLOAN DEKTAK 6M #9105277 for sale
VEECO / SLOAN DEKTAK 6M is a wafer testing and metrology equipment designed to measure surfaces and thin films on semiconductor wafers. This system offers a combination of scanning tunneling microscopy (STM) and atomic force microscopy (AFM) technology to provide in-depth surface characterization of semiconductor wafers. It is capable of producing three-dimensional topographical maps of wafer surfaces with nanometer-level resolution. VEECO DEKTAK 6M unit is mainly designed for process control in semiconductor production. The machine can be utilized to accurately measure and monitor semiconductor layer thickness during the production process. This allows for the analysis of critical process control steps and ensures that the product quality is in compliance with customer requirements. The tool is also ideal for the creation of quality metrics and documentation standards in the production process. SLOAN DEKTAK 6M asset is also capable of monitoring wafer parameters such as step height, flatness, and topography. Its measurement range covers a variety of semiconductor parameters including butyl lithography, alloy thickness, electrical resistivity, and inter-layer dielectric. The measurement data obtained by the model can be used to evaluate the uniformity and process control of the semiconductor layers. DEKTAK 6M equipment is integrated with a variety of features that ensure accurate and reliable data collection and analysis. It includes a motorized precision stage that allows for precision movement and positioning of the wafer surface. The system is also integrated with a programmable teach-in teaching unit which allows for efficient operation and automates frequency-based data collection for surface analysis. For non-contact data collection, the machine also has a semiconductor module equipped with an emission array and laser scanning tool. VEECO / SLOAN DEKTAK 6M asset is compatible with a range of software applications, including VEECO WaferPro Software, which provides powerful data management and analysis tools. This software is designed for easy data manipulation and can create 2D or 3D plots of STM or AFM data. It also offers various visualization tools such as cross-sectional and statistical plotting for in-depth analysis. To ensure maximum performance, the model features an environmental monitoring equipment that regulates the temperature and humidity in the testing environment. This ensures stable measurements throughout the entire process. VEECO DEKTAK 6M is an integrated metrology solution for wafer testing and metrology in semiconductor production. It offers a combination of scanning tunneling microscopy and atomic force microscopy technology for accurate surface characterization of semiconductor wafers. It also provides reliable and robust features such as precision motorized stages, programmable teach-in teaching system, and a comprehensive software suite for efficient data management and analysis.
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