Used VEECO / SLOAN DEKTAK 8 #293610046 for sale

VEECO / SLOAN DEKTAK 8 is a state-of-the-art wafer testing and metrology equipment designed to quickly, accurately and repeatably measure the profile of semiconductor wafers. This advanced system utilizes a patented vertical scanning interferometry technique known as a "stylus profilometer" to generate three dimensional images of semiconductor sputter and etch mask profile topography. This enables operators to quickly and accurately inspect the sample and make meaningful measurements. VEECO DEKTAK 8 is a compact and easy to operate unit featuring an automated data acquisition machine and a precision step motor that controls the vertical trace chaser. The tool's load-lock design provides for an inert environment, allowing for repeatable results without the influence of environmental variables. SLOAN DEKTAK 8 asset offers a range of stylus geometries, from flat tips to diamond tips with nominal radii from 1 to 8 µm. The stylus tips are designed to resist the effects from particle contamination, fingerprint smears and other forms of degradation. The model allows for a variety of sample configurations such as circles, rectangles, and complex shapes with sample surface areas from 2-200 square millimeters. It provides a choice in magnifications ranging from 40x to 300,000x with a normal lateral resolution of 0.6µm. The Dektak interface software enables the user to configure automated measurements, acquire, store and display a 3D image of the sample topography in a variety of graphical formats depending on the test requirements. The detailed output graphs allow user to easily identify defects and other inconsistencies in the topography. The software can also be used to generate detailed documentation of test results and when used with Wi-Fi enabled tablet PCs it allows for remote data acquisition operations. DEKTAK 8 is the ideal solution for any application requiring precision, repeatable measurements with quick turnaround times. This ergonomic and user-friendly equipment is designed to maintain accuracy over hundreds of repeat inspections, making it ideal for spec conformance and other reliability tests.