Used VEECO / SLOAN DEKTAK 8 #293657919 for sale

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ID: 293657919
Advanced Development Profiler (ADP).
VEECO / SLOAN DEKTAK 8 is a sophisticated wafer testing and metrology equipment designed to provide accurate and reliable measurements of a variety of parameters, including surface topography, critical dimensions, microelectronic device parameters, gate structures, and line widths. It is designed for precision scientific applications, primarily for research facilities, universities, and industrial developers. VEECO DEKTAK 8 comprises two separate modules that work collaboratively; a measurement module and a display module. The measurement module is equipped with a laser interferometer, which provides non-contact measurement of surface topography across the entire surface of the wafer. It also comprises a drive motor, two x-y axes, and a z-axis with a range of 12 millimeters and a resolution of 0.2 nanometers. This enables the system to precisely measure even the smallest of wafer features, resulting in data of exceptional accuracy and repeatability. The display module then processes the data collected by the measurement module, integrating it to produce an accurate image of the wafer's profile in real-time. This gives researchers the ability to precisely analyze and compare data, which can then be used to make informed decisions about the design of the wafer. SLOAN DEKTAK 8 also comes with a selection of dedicated software programs to best support any application. Features also include a touchscreen user interface and a reporting function, which allows for results to be quickly and easily documented as part of a research report. Adjustable optical parameters also allow researchers to tailor the unit to suit their particular application. To make sure the results are as accurate as possible, DEKTAK 8 comes with an alignment- and calibration-check machine, providing an effective and reliable way of ensuring accuracy over time. VEECO / SLOAN DEKTAK 8 is a highly capable tool, offering a host of features and functions specifically tailored to wafer testing and metrology applications. Its combination of precision and reliability makes it an invaluable tool for researchers and developers of all kinds.
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