Used VEECO / SLOAN DEKTAK 8 #9006095 for sale

VEECO / SLOAN DEKTAK 8 is a sophisticated wafer testing and metrology equipment designed for both R&D and production environments. It features a powerful x-y scan engine and easy-to-use software that provides sophisticated data processing and analysis functions. The system can accurately measure profile, surface, step height, flatness, and critical dimensions of 200 mm, 150 mm, 75 mm, and 50 mm wafers up to 30 µm in thickness. A high speed Z-axis drive controls the scanner and provides a resolution of up to 0.4 µm. The scanner also has built-in sensors to compensate the surface deformation of the tested wafer. VEECO DEKTAK 8's software provides a range of automated wafer analysis capabilities, including measurement of overlays, critical dimensions (CDs), reflectivity, and step heights. It also includes automated contour alignment, which optimizes the wafer mapping process for increased accuracy. The software also supports direct import or export of data through an available API to facilitate convenient integration with other systems such as process simulation and equipment control systems. The unit features a customizable and easy-to-use graphical user interface, as well as an assortment of enhanced hardware and software features. For instance, the machine utilizes a large touch screen display and panel-type controls for simplified operation and an advanced high-speed video subsystem that enables a cross-sectional view of the wafer for more precise evaluation. SLOAN DEKTAK 8 offers additional features designed to boost efficiency, such as high productivity test modes and fast printing capabilities. It also supports traceable measurements and maintains records of all measurements for reliable data tracking. DEKTAK 8 wafer testing and metrology tool is an advanced tool for precise wafer evaluation and analysis. With its accurate measurements, amenable user interface, and excellent test and tracking capabilities, it provides a powerful solution for improved wafer testing and metrology.