Used VEECO / SLOAN DEKTAK 8 #9298939 for sale

VEECO / SLOAN DEKTAK 8 Wafer Testing and Metrology equipment is a valuable tool used in the testing and analysis of wafers for quality inspection and assurance. This system uses scanning tunneling microscopy (STM) technology in order to produce highly-accurate measurements of the surface of a wafer. With a 3-axis, high-resolution stage and superior optical and digital systems, this unit offers repeatable surface analysis with a high level of accuracy. The main purpose of VEECO DEKTAK 8 machine is to measure and analyze the surface topography of a wafer, to identify defects and defects trends, and to trace defects from one wafer to an entire production run. The tool measures the surface topography of a wafer from 10nm to 420nm using three-dimensional measurements. The asset can measure a wide range of parameters such as thickness, surface flatness, and raised and pitted surface features. It also offers critical analysis of profile geometry, surface roughness, and structure features such as pits, bumps, and trenches. In order to ensure accurate results, the model offers a variety of scanning techniques, including SPM scanning on available camera systems, Oscillation Scanning, X-Y Plotting, and Residual Damage Profile measurements. Additionally, SLOAN DEKTAK 8 includes various data processing techniques which analyze the data collected with the equipment in order to further support and increase the accuracy of the system. The unit offers a range of advanced functionalities, such as a High performance motion machine with low-speed autofocus technology and vibration reduction. Additionally, it offers a variety of microscope cameras and optical systems including a variable which allows the user to choose between reflection, transmission or both for optimal image quality. Furthermore, the integrated device interfacing software allows users to connect to various external instruments, including data analyzing software, such as particle size measuring software, CCD imaging, laser mapping, and beam profiling software. DEKTAK 8 wafer testing and metrology tool offers users a powerful and efficient way to assess wafer quality and to identify and analyze defects. This unique asset allows for precise and repeated measurements with excellent accuracy, and it includes advanced features that streamline and enhance workflow processes. This model is perfect for applications in the semiconductor industry, and its accuracy and reliability makes it a leader in the industry.