Used VEECO / SLOAN DEKTAK 8 #9394873 for sale

VEECO / SLOAN DEKTAK 8 is one of the leading wafer testing and metrology systems. It is a high-precision step-height measurement equipment which uses a technique known as 'vertical scanning interferometry' or VSI. This system utilizes a high-resolution stage, optics and controller to measure the vertical dimensions of integrated circuits on a wafer's surface. VEECO DEKTAK 8 has a patented vertical motion platform, which enables it to scan very small features with a high level of accuracy. The platform is driven by a high-speed vector drive controller with a resolution of 0.25 microns, enabling SLOAN DEKTAK 8 to measure the height of features on the surface of the wafer with an accuracy of ≤ 0.25 μm. The unit also features an intuitive user interface which is designed to enable operators to quickly obtain reliable data for their measurements. DEKTAK 8 has a maximum scanning control speed of 15mm/s, and its subsystems allow for a wide range of measurements. This includes topography, surface texture, flatness, height uniformity and thickness measurement. The machine also utilizes a computer-controlled vision tool with a large image field-of-view which allows for high-resolution images of the sample's surface. VEECO / SLOAN DEKTAK 8's operator workstation is a fully-integrated asset which includes support for both Windows and Mac operating systems. It enables direct access to a wide range of graphical data output and image processing functions. The workstation also allows for data capture and special video and editing capabilities for in-depth analysis of the wafer. VEECO DEKTAK 8 is easy to operate and utilizes a variety of software tools to help optimize productivity. High precision is achieved through automatic focus and a patented feature to minimize distortion. The output data can also be easily saved for later review and post-processing. The model is also FDA and GMP compliant, meeting all the applicable environmental standards. Overall, SLOAN DEKTAK 8 is one of the most advanced step-height wafer metrology systems available. Its unique features and robust design and performance make it ideal for a wide range of applications such as advanced wafer measurement and thickness analysis of integrated circuits. Its high level of accuracy, flexibility and user-friendly design gives the equipment an edge over its competition.