Used VEECO / SLOAN DEKTAK 8000 #9133054 for sale
VEECO / SLOAN DEKTAK 8000 series of wafer testing and metrology systems is a state-of-the-art tool designed for high throughput, accurate, and reliable measurements of semiconductor or MEMS device wafers. It is a modular platform with the latest optics, mechanical, and electronic components, making it versatile to meet today's high performance production requirements.VEECO DEKTAK 8000 is built with a 0.5 retractable macro-probe that can detect 0.1 micron nanoscale features and measure contact resistance, leading to increased production yields. The contact force is adjustable for different materials and probes, while the automated probe exchange feature further extends its flexibility. The real time automatic defect detection equipment identifies and flags defects in real time as the probe scans the wafer, helping to reduce costly scrap. SLOAN DEKTAK 8000 is equipped with a CCD imaging system with modern Al and machine learning capabilities, enabling face-up surface topology measurements. It also has an advanced imaging microscope and auto focus to capture detailed nano-structures and features. In addition, its integrated calibration wizards coupled with its unique noise suppression algorithms, guarantee the acquisition of unparalleled metrology information for a wide range of metal and 3D structures. DEKTAK 8000 features a 3-axis motion unit, with a high-speed scanning module that ensures fast, repeatable measurements. With its high throughput and accuracy, this machine enables enhanced data acquisition for 3D layers, bumps, and contacts on advanced semiconductor devices. The intuitive user interface enables quick and easy programming, and its onboard real-time graphics and graphing capabilities make it easy to identify and analyze product trends. Furthermore, VEECO / SLOAN DEKTAK 8000's Software Certification Program ensures that all software platforms of the tool are regularly tested for compliance with industry standards. All in all, VEECO DEKTAK 8000 series is an advanced wafer testing and metrology asset that offers high throughput, accurate, and reliable measurements to help reduce production costs and maximize yields for modern semiconductor and MEMS devices. It is designed for maximum efficiency, stability, and scalability, making it the perfect platform for continuous and precise in-line process control.
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