Used VEECO / SLOAN DEKTAK I #78840 for sale
VEECO / SLOAN DEKTAK I is an advanced auto stylus-based wafer testing and metrology equipment that enables precise contact measurements for topographical (geometric) surface testing. This system has wide-ranging capabilities, providing substrates ranging from as small as 2.5mm in diameter to as large as 200mm in diameter. The unit features a long-life, electrochemical stylus optimized for critical substrates while also providing the flexibility to perform measurements over a wide range of speeds, allowing users to locate 'critical geometries'. VEECO DEKTAK I features a high-speed counter to measure and record data at 10,000 points per second, allowing quick and accurate measurement of surface features. Additionally, the machine incorporates a high-resolution data acquisition electronics tool for exact resolution of up to 2000 lines/mm. The asset allows analysis and data manipulation in real time through its included PC/Linux software. The model can be operated in a variety of lighting conditions, including bright field, dark field, and polarized reflected vision enhancements. SLOAN DEKTAK I offers numerous advantages, including precise and accurate surface testing, data acquisition, and analysis capabilities. The equipment can provide precise measurements of topographical surface features such as active area sizes, V-scores, steps, step heights, and roughness characteristics. Additionally, the system can measure flatness, waviness, and warpage under a variety of conditions. Its integrated electronics has several features, including a TouchScan feature that allows precise control over the scanning area, and dedicated keys for easy data manipulation and programmable buttons for quick access to frequently used functions. Additionally, the unit's advanced optics machine offers an extended depth-of-field, which helps in accurately capturing detailed surface features. In conclusion, DEKTAK I wafer testing and metrology tool is an advanced auto stylus-based asset that enables precise contact measurements of topographical (geometric) surface testing. The model offers a host of advantages, including high-speed data acquisition, easy data manipulation, and advanced optics. Additionally, the equipment can make precise measurements of a variety of surface features, including steps, step heights, and roughness characteristics. With its numerous advantages and features, VEECO / SLOAN DEKTAK I is a powerful and versatile wafer testing and metrology system that is ideal for any application that requires precise and accurate surface testing.
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