Used VEECO / SLOAN DEKTAK I #9018952 for sale
Profilometer Model: 9000050 Film thickness gauge Film and chart recorder.
VEECO / SLOAN DEKTAK I is an advanced wafer testing and metrology equipment designed for ultra-precise surface topography profiling and analysis. The system is capable of measuring a wide range of geometrical characteristics of semiconductor wafers, including diameter, flatness/levelness, surface roughness, as well as other metrology such as height, depth, and critical dimensions. VEECO DEKTAK I utilizes a capacitive probe which is precisely aligned with a motor controlled x-y table in order to move the probe along the sample topography. This enables the unit to accurately measure and scan the wafer surface with high precision. The machine comes with a graphical user interface that allows the user to interactively monitor and control the tool's operation. It also has an optical encoder that provides feedback to ensure accuracy during the scanning process. Additionally, an adapter allows the asset to be interfaced with a variety of external instruments and peripherals. The model also features various built-in corrections and automated positioning along with optimized scan paths to capture maximum resolution from the wafer surface. SLOAN DEKTAK I also provides the user with advanced graphical analysis tools to allow for further analysis of the recorded data. These tools can be used to create detailed surface topography maps, 3D surface views, and other geometrical profiles of the wafer surface. Overall, DEKTAK I is an advanced wafer testing and metrology equipment designed to provide precise measurements and analysis of semiconductor wafers. The system is capable of capturing and analyzing a wide range of geometrical features of the sample surface, and features advanced graphical analysis tools to allow the user to more thoroughly analyze the data. Additionally, the unit is designed to simplify operation and ensure accurate probing and scanning of the wafer surface.
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