Used VEECO / SLOAN DEKTAK II #293831034 for sale

VEECO / SLOAN DEKTAK II
ID: 293831034
Profilometer.
VEECO / SLOAN DEKTAK II is an advanced wafer testing and metrology system designed for the analysis of various semiconductor materials, such as silicon, gallium arsenide, and more. The unit is capable of performing a wide array of measurements, such as thickness and surface profile, wafer flatness, resistivity, and depth profiling. VEECO DEKTAK II comes with an optically-based optical micro-profiler that enables precise vertical and lateral measurements with a minimum overturning resolution of less than 0.1 microns. Its patented stylus technology and brushless deflectionarm allows for superior repeatability and accuracy, making it ideal for industrial processes and precise measurements. It also features a high-speed laser scanner for precise topographical and extended-area thickness measurements. This laser scanner tracks the wafer from the side instead of from the front, reducing the potential for non-uniformity. SLOAN DEKTAK II also features a built-in temperature-controlled workstation, eliminating user set-up time, and enabling measuring of nanoscale structures. DEKTAK II's intuitive user interface allows for quick learning and easy operation. It includes a PS2/USB interface for convenient data transfer and storage, along with a variety of software options that allow for customization of the measuring system's parameters. It also includes multiple language options, free of charge, making the system truly global in nature. VEECO / SLOAN DEKTAK II provides comprehensive analysis in various test modes including step height, roughness, flatness, lift-off, and slope. Analyzing data is taken and performed efficiently and reliably, driven by numerous advanced features such as fast-moving laser scanning with accuracy of 2 microns for step height, 4 microns for roughness, and extended area measurement of up to 500 microns. Overall, VEECO DEKTAK II represents an outstanding technological advancement in wafer testing and metrology. Its advanced and robust capabilities, combined with its intuitive user interface, make it one of the most dependable and cost-effective analysis solutions on the market today.
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