Used VEECO / SLOAN DEKTAK II #68582 for sale
Profilometer, includes microscope and monitor Measurement display range: 20-65,000 nm or 200-655,000 angstroms.
VEECO / SLOAN DEKTAK II is a wafer testing and metrology equipment used to measure critical surface features on modern semiconductor devices such as nanoscale FETs (field effect transistors). This system uses an advanced atomic force microscope (AFM) to achieve an accurate and detailed three-dimensional map of a wafer with nanoscale resolution. This helps construction and testing of semiconductor devices in a few wafer diameter steps, thus providing superior surface mapping results that are highly accurate, detailed, and repeatable. VEECO DEKTAK II unit is also well suited for more conventional metrology techniques such as stylus and optical profilometry as well as advanced options like surface roughness, sub-surfacestructuring, and more. The machine's advanced AFM enables 3D imaging and research, which is coupled with a patented 'flex-drive' option that makes the tool extremely adaptable. The asset can easily be configured and optimized for a wide range of topography and surface structure measurements, including those for which limited data sets or new wafer types are available. The model also provides one of the highest levels of automated operation available, greatly reducing manual decision making by allowing users to make data collecting decisions based only on the data collected by the equipment. This minimizes human errors, shortens test cycles, and decreases the time and money spent during wafer testing. Additionally, the system is powerful enough to handle multiple wafer sizes, from 1 inch to 8 inches in diameter, and includes a data acquisition suite that incorporates features such as multi-image acquisition, as well as statistical metrology. Overall, SLOAN DEKTAK II is a dependable and reliable wafer testing and metrology unit designed to meet all expectations of accuracy, resolution, and speed. With its wide range of automated functions, compatibility with various wafer sizes, and the flexibility offered via its AFM and other advanced functions, this machine is suited to many different testing applications. Thanks to its combination of advanced AFM and optical techniques, DEKTAK II is a highly functional and cost-effective tool that any semiconductor manufacturer can trust in order to have accurate and reliable results.
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