Used VEECO / SLOAN DEKTAK II #9223578 for sale

VEECO / SLOAN DEKTAK II is a high precision equipment that is used for wafer testing and metrology. This system is capable of measuring the topography of wafers with nanometer scales of accuracy. It also features real-time imaging of sites on a wafer in three dimensions. VEECO DEKTAK II is equipped with an optical scatterometer which provides further data about the wafer surface. It also comes with a digital image processor, which can analyse the images and create a three-dimensional profile of the wafer surface. The unit functions by first tracing a circular path around the wafer's circumference. As data is recorded, it is used to produce a three-dimensional map of the wafer's surface topography. The machine utilizes a small scanning force applied to the wafer's surface, and can measure depths down to 0.1 nanometers. The tool is flexible, and has several options for different types of measurements. It is capable of measuring a variety of wafers, ranging from silicon wafers to MEMS wafers, and can analyze these samples in a variety of ways. For example, one can analyze shape, step height, resistivity, and other sample properties. The asset is linked to a PC which can be used to store measured data, as well as to analyze it. This model also includes a graphical user interface, making it easy to use. The data can be outputted in a variety of formats, giving users the flexibility to interpret the results in the manner they choose. SLOAN DEKTAK II is a highly accurate and versatile tool that can be used for precise measurements and analysis of different kinds of wafers. It provides a reliable, efficient, and comprehensive approach to wafer metrology and testing. It is a valuable tool in the fields of semiconductor and MEMS production and research.