Used VEECO / SLOAN DEKTAK IIA #293752410 for sale

VEECO / SLOAN DEKTAK IIA is a high-performance wafer testing and metrology equipment designed for semiconductor testing applications. VEECO DEKTAK IIA has a number of integrated features that make it an ideal system for semiconductor testing, such as automatic measurement of static electrical properties and in-line scanning. In addition, it has an advanced surface contouring unit which enables the operator to precisely define the wafer surface to monitor wafer shape, critical dimension, and other electrical properties. The unit includes a 16" x 8" wafer stage to enable simultaneous measurements of up to 8-inch diameter wafers. The ISO-standard 6-point probing machine enables flexible alignment of the probes on the wafer in order to optimize test quality. The integrated scanner allows for automated measurement of static electrical properties and in-line scanning of larger wafer areas. The software also supports data analysis, off-line operation, and data storage of the wafer measurement results. SLOAN DEKTAK IIA offers advanced instrument accuracy and repeatability for high-precision measurements. Measurement accuracy is ensured by the encoder scale for lateral and vertical sample positioning and the precision frame that prevents pitch and roll errors. The laser metrology tool features a highly accurate and stable six-axis laser interferometer to measure sample tilt and the size and shape of the structures. Finally, the asset includes an intuitive user interface that allows the operator to quickly setup and run the measurement program. The user-friendly graphical environment simplifies parameter selection to minimize setup time. The model also includes an array of process controls to ensure a repeatable and accurate measurement process. In conclusion, the VEECCDEKTAK IIA is an advanced wafer testing and metrology equipment that meets the demands of semiconductor testing and offers high precision results with integrated features that make the system easy to use. The wafer stage's dimensions, along with the scanner and the integrated metrology tools, make it a comprehensive and reliable unit for wafer testing and metrological measurements.