Used VEECO / SLOAN DEKTAK IIA #82918 for sale

ID: 82918
Wafer Size: 8"
profilometer, includes video camera and monitor.
VEECO / SLOAN DEKTAK IIA is a wafer testing and metrology equipment designed for inspecting wafers for physical and electronic defects, performing wafer mapping and defect counts. The system includes a laser scanning head, a computer-controlled microscope, and a touch-screen data entry device. The laser scanning head is used to rapidly scan the surface of the wafer and detect any defects or uneven areas. The computer-controlled microscope is used to further inspect the scanned area and identify any other defects. The touch-screen data entry device facilitates easy and quick data entry. VEECO DEKTAK IIA unit also includes a number of software programs which help to analyze the data obtained from the microscope and laser scanning head. These programs allow for the comparison of scanned data against predetermined parameters, as well as graphical displays of the wafer for further analysis. The software can also output a variety of key metrics regarding the quality of the wafer such as defect counts, defect densities, and mapping data. SLOAN DEKTAK IIA machine is specially designed to perform fast and accurate testing of various kinds of wafers. The analysis of a single wafer can take as little as 15 minutes with the help of this tool. This makes it ideal for quality control and inspection of wafers during the production process. The convenience and efficiency of using DEKTAK IIA asset make it a great choice for wafer testing and metrology. It allows for the fast and accurate inspection of wafers and provides a reliable mechanism for quality control. As a result, it is a key tool for producing high quality wafers that adhere to strict industry standards.
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