Used VEECO / SLOAN DEKTAK IIA #9113674 for sale

ID: 9113674
Profilometer Surface profile measuring system.
VEECO / SLOAN DEKTAK IIA is a wafer testing and metrology equipment designed to deliver quality control in the manufacture of semiconductor devices. It is capable of measuring characteristics such as film thickness, surface roughness, pull-off and adhesion strength. The system is designed to be used in laboratories and production facilities to help ensure that the rigorous quality control standards of the industry are met. VEECO DEKTAK IIA consists of a mainframe, an XYZ probe head, a Z data reader, a control console, a digital display, a floppy disc drive and an 8mm video cassette recorder. The mainframe contains the unit's software, which controls the movement of the probe head according to a set of commands. The XYZ probe head is mounted on a motor-driven platform that allows for precise positional control and accurate metrology of wafer surfaces down to a resolution of 1nm. The Z data reader powers a row of force sensors used to measure film thickness and surface roughness. The control console is used to input and monitor machine parameters, such as set-points and measurement cycles. The digital display allows for the comprehensive viewing and analysis of data. The 8mm video cassette recorder enables the capture, storage and replay of recorded videos of scanned wafer surfaces. Additionally, SLOAN DEKTAK IIA is expandable via digital I/O, and can be easily interfaced with PLC's and SCADA systems. All of these features make DEKTAK IIA an attractive and versatile solution for a variety of semiconductor device measurement and metrology applications. VEECO / SLOAN DEKTAK IIA provides fast and reliable surface scanning and accurate measurements while maintaining an inexpensive price point and user-friendly operation.
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