Used VEECO / SLOAN DEKTAK IIA #9397420 for sale

VEECO / SLOAN DEKTAK IIA
ID: 9397420
Surface profilometer.
VEECO / SLOAN DEKTAK IIA is a wafer testing and metrology equipment designed to provide accurate measurement and test results for various semiconductor devices. VEECO DEKTAK IIA is a tabletop device that utilizes a patented scanning stylus that is driven by a servo motor. This system is capable of measuring profile heights of thin films, step heights, patterned features, and other topographical information with high precision and accuracy. Through SLOAN DEKTAK IIA's USB interface, the unit allows for quick and easy control of configurations, data collection, visualization and analysis. The machine uses scanning electron beam technology to achieve fast and reliable 3D topographical information for various samples. The motorized servo drives the stylus to move in the X and Y direction over the e sample surface, while the stylus follows the sample's height profile and records its data points. Analysis and visualization of the measurements can be performed directly in DEKTAK IIA software. The software provides real-time visualization of profile surfaces as they are obtained. It also has the ability to export the data as output files that can be used as input for 3D Mapping and 3D Image Analysis. The software also offers various post-processing functions such as linear measurement, cross-sectional profile, area analysis, and spectrum analysis. VEECO / SLOAN DEKTAK IIA tool is widely recognized for its high-speed performance and accuracy. Its measuring resolution can reach up to 0.1nm in step heights and 2nm in profile heights, making it suitable for cutting-edge wafer testing and metrology applications. The asset also possesses a high-speed scanning capability, allowing it to measure up to 150 points per second in order to acquire fast and accurate information for sample inspection. VEECO DEKTAK IIA offers a compact design, allowing it to fit on lab benches and easily match any wafer testing and metrology environment. Furthermore, it provides a more affordable wafer testing and metrology solution than traditional systems, and easier maintenance and operation. All in all, SLOAN DEKTAK IIA is a highly efficient, accurate, and cost-effective solution for those in need of wafer testing and metrology.
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