Used VEECO / SLOAN DEKTAK IID #9061409 for sale
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VEECO / SLOAN DEKTAK IID is an automated wafer testing and metrology equipment, designed to quickly and accurately measure a variety of semiconductor components and processes. The system is a combination of high-performance optical metrology tools and powerful wafer testing technologies that can help meet the stringent demands of today's advanced semiconductor markets. VEECO DEKTAK IID features a unique combination of positioning capabilities, cutting-edge imaging technology, and advanced testing and metrology methods. The unit includes advanced optical systems that use bright light streams, traveling-wave displacement technology, and laser diode alignments to accurately measure both flatness and profile of a wafer. Additionally, SLOAN DEKTAK IID can fit in a variety of substrates, tool types, and test types. The machine is equipped with a high-speed area scan control feature to provide precise and accurate readings every time. The tool is also configured to accommodate a wide range of wafers sizes, including substrates of up to 8, 12, or 15 inches in diameter. The high-performance area scan control allows for faster test times and higher throughput. DEKTAK IID also features several integrated drawing and reporting capabilities. Users have the ability to develop customized tests and drawings to quickly set up new tests and maintain consist quality results. The asset's integrated drawing editor and wafer processing tools make creating drawings and tests faster and simpler. In addition to these integrated tools, the model also offers a wide range of options for advanced wafer testing and metrology. The equipment can measure and display different types of data, such as CD values, wafer outgas levels, peptide differences, flatness, dielectric measurements, and surface roughness levels. Additionally, VEECO / SLOAN DEKTAK IID is capable of detecting variation in feature size and pitch, allowing for improved process control and reduced process variation. Overall, VEECO DEKTAK IID is a reliable, accurate, and high-performance wafer testing and metrology tool. By combining advanced optical technologies with powerful testing capabilities, SLOAN DEKTAK IID provides users with quick and dependable results, which can help to reduce time-to-market and improve overall semiconductor performance.
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