Used VEECO / SLOAN DEKTAK V-200 Si #293592033 for sale

VEECO / SLOAN DEKTAK V-200 Si is a highly advanced wafer testing and metrology equipment. It is designed to measure the exact size, shape, and other characteristics of semiconductor wafers and other precision components. The system is extremely precise and efficient in its measurements, making it ideal for any application requiring precise evaluation of wafer characteristics. VEECO V200-SI utilizes a variety of advanced technologies in order to most efficiently and accurately evaluate the quality of the wafers. The unit uses a precise microscope to scan the wafer surface with utmost accuracy. Additionally, the laser and interferometer technology help measure any features such as line widths, and profile dimensions found on the wafer surface. In addition to the precise measurements taken in the machine, the DEKTAK can also quickly and accurately scan for defects on the wafer. An acclaimed, state-of-the-art Point-to-Point, slit-laser, module ensures extremely precise defect detection, allowing for even the most minute of defects to be easily detected. In addition, both dark-field and bright-field imaging can be used to obtain an enhanced view of the finished surface. SLOAN DEKTAK V200 SI also offers an impressive range of interfaces, enabling it to be integrated into existing wafer systems, and support both local and remote users. This makes it possible to access and analyze the data online, and accurately compare results from multiple systems around the world. The tool is versatile enough to be used in a wide variety of wafer testing applications, including the ongoing evaluation of wafer quality in manufacturing. It is compatible with both single- and double-sided wafers, and is capable of measuring both opaque and transparent wafers. In sum, SLOAN DEKTAK V- 200 SI is an extremely versatile, efficient, and precise wafer testing and metrology asset which provides high-quality results for any application requiring accurate evaluation of wafer characteristics. It is an ideal choice for an organization seeking a high-performing and reliable metrology model.