Used VEECO / SLOAN DEKTAK V-200 Si #293609202 for sale

VEECO / SLOAN DEKTAK V-200 Si is a wafer testing and metrology equipment that delivers repeatable and accurate measurements of a wide variety of semiconductor structures. It offers several measuring capabilities, such as determining surface topography, critical dimension, gate height, resistivity, and sidewall angle. The V-200 Si utilizes a non-contact optical profilometer to measure the surface elevation of the wafer, enabling the accurate and repeatable acquisition of surface topography data. It also provides various analysis modes such as 3-D point analysis, line scan, area scan, cursoring, and profile validation scanning. This system allows the user to view a wide variety of profile parameters including height and width, as well as detailed information about the profile, including line-by-line data. To accurately measure critical dimension (CD), the unit's On-Axis CD/Sidewall Angle Measurement functionality is used. This measures CD along with the associated sidewall angle measurements, in one step. In comparison to other systems, the V-200 Si is capable of obtaining CD measurements of features down to 0.1 nanometers, with angle measurements down to 0.1 degrees. The V-200 Si can also measure gate heights in the nanometer and micrometer range. Its cross-sectional micro-analysis, enables the user to analyze the entire profile in both profile and cross-section modes. To measure resistivity on the machine, the user chooses from a variety of scannable probe tips, including both manual and automated, as well as joystick, scanning, and optical modes. The V-200 Si tool aims to provide reliable and accurate data, by utilizing a high precision stage and effective surface scanning capabilities. Additionally, the asset has a user-friendly interface, allowing users to customize and save operator reports. For enhanced performance and operation, the model is Windows 10 compatible and is compatible with a variety of operating systems. This facilitates the transfer of data to and from the computer, and improves the equipment's overall efficiency.