Used VEECO / SLOAN V200-SL #195871 for sale

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VEECO / SLOAN V200-SL
Sold
ID: 195871
Surface profilometers.
VEECO / SLOAN V200-SL is a wafer testing and metrology equipment designed to deliver accurate and reliable process control performance. It is based on a standard platform that integrates powerful optics and software to deliver comprehensive analysis and repeatability. The system is composed of a metrology platform, metrology subsystems, and user interface. The metrology platform comprises five major components: The vision unit, the stage hardware, the optics, the positioning, and the robotics. The vision machine employs both forward-look and side-look microscopes, each capable of full wafer examination, as well as automated spot inspection capabilities. The platform enables high-resolution imaging in the UV, visible, and near-infrared spectra. In addition, the tool is capable of cover slip inspection with a variable shape area scan that can be set to address both fine and coarse features. The metrology subsystems, including image analysis and processing, are designed to provide the user with the capability to quantify and optimize process control parameters and to provide qualitative assessments of wafer quality. The automated measurement functions within the metrology subsystem are designed to measure and monitor a wide range of wafer characteristics. In addition, specific software options are available for measuring characteristics that are specific to a customer's application. The user interface is designed to be intuitive and user-friendly. Through its various software functions, users are able to access data, control the asset, and generate reports of analysis and measurements collected. VEECO V200-SL provides advanced wafer testing and metrology capabilities in a highly versatile and reliable platform that is designed for long-term, high-end wafer testing and metrology performance. Its advanced capabilities, intuitive user interface, and comprehensive integration of systems makes it the perfect choice for any process control, research, or development application.
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