Used VEECO / SLOAN DEKTAK V-300-Si #9089205 for sale

VEECO / SLOAN DEKTAK V-300-Si is a high-precision wafer testing and metrology equipment designed to provide nanometer-level measurement accuracy in an automated environment. The system offers an assortment of capabilities to help researchers accurately characterize a variety of materials such as semiconductors, metals, polymers, and composites, enabling them to get precise data from the material's surface topography, dimension, and material properties. The V-300-Si is a precise wafer testing unit featuring a combination of optical profiler and Atomic Force Microscopy (AFM) capabilities, combining to make a powerful solution for testing and metrology of semiconductor and other materials. The V-300-Si's optical profiler utilizes a Series 500 interferometer based on a HeNe laser light source for precise, repeatable measuring and imaging at nanometer resolution. The unit offers four levels of analysis and feedback with automatic recognition, handling, and indexing features and a range of vertical displacement up to 200 micrometers, allowing users to easily analyze vertical step heights and other features. The V-300-Si's Atomic Force Microscopy (AFM) mode also yields exceptionally precise results, allowing users to measure and image surfaces in up to 4 simultaneous channels with a vertical resolution of 0.1 nanometer and lateral resolution up to 3.2 nanometers. It also features an integrated High Voltage Generator IC, allowing for the measurement and control of electrostatic charges which are oftentimes present on substrate surfaces. In addition to its incredibly precise engineering capabilities, the V-300-Si also offers several highly usable features for enhanced operational efficiency. These include an ergonomic design, an easy-to-use graphical user interface, as well as multiple data output formats and statistical analysis capabilities, all of which help make the work process easier and more efficient. Overall, VEECO DEKTAK V-300-Si is an outstanding wafer testing and metrology machine that offers great precision and multiple features to help researchers accurately characterize a variety of materials with speed and accuracy. It's an incredibly reliable and versatile tool for measuring surface properties, vertical steps, and surface material properties.