Used VEECO / SLOAN DEKTAK V-320 Si #9103879 for sale

VEECO / SLOAN DEKTAK V-320 Si is a versatile wafer testing and metrology equipment designed to provide reliable and accurate wafer measurement for a wide range of wafer sizes and thicknesses. The system utilizes a unique vacuum-assisted stage that enables the efficient movement of wafers while providing reliable positioning and auto-alignment. The unit is equipped with a powerful high-speed motor, which ensures fast and accurate measurement even when dealing with multiple wafers. The V-320 Si has an integrated optical measurement machine that provides highly accurate, repeatable measurements at the nanometer level of resolution. The optical tool is equipped with a 5x, 10x, 20x, and 50x objective lenses. Additionally, the asset can be customized with a variety of objective lenses to provide the ideal performance for different wafer sizes and characteristics. Equipped with advanced software and an intuitive graphical user interface (GUI), the V-320 Si is easy to learn and use. This advanced equipment will provide users with accurate results and interpretation of measurements for all wafer sizes and shapes. The V-320 Si allows for non-contact non-destructive metrology, making it one of the most reliable and versatile wafer testing and metrology systems available. By enabling non-contact testing, the V-320 Si eliminates any potential damage that can be inflicted by contact-based testing. The model is also capable of measuring several parameters on different wafers in rapid succession, increasing its efficiency and reducing labor costs. Additionally, the V-320 Si offers a superb combination of high resolution, accuracy, repeatability, and speed that ensures reliable, precise measurements. The V-320 Si provides users with improved data analysis as well. The equipment is equipped with a powerful Data Analysis Module (DAM) which offers a variety of graphical representations and statistical functions that can be used for visualization and further analysis without the need for external software. Additionally, the system offers the opportunity to calibrate wafers and monitor parameters over long periods. In conclusion, the V-320 Si is an excellent wafer testing and metrology unit that offers a reliable, cost-effective and accurate way to measure a variety of wafer sizes and thicknesses. The machine is equipped with powerful and user-friendly software that makes it easy to operate and learn, as well as robust tools for analysis and data visualization and interpretation. This advanced metrology tool is the ideal solution for any wafer testing process.