Used VEECO / SLOAN V200-SL #9257117 for sale

VEECO / SLOAN V200-SL is an automated wafer testing and metrology system from VEECO Metrology. It is designed for advanced wafer characterization and analysis for materials such as gallium nitride, carbon nanotubes, semiconductors, and other optoelectronic wafers. VEECO V200-SL is capable of high-precision, non-contact imaging and characterization of a variety of materials across multiple wavelengths. It includes an imaging scanner that provides up to 13.3X magnification, with a resolution of 1 to 10 nm. The system also incorporates SLOAN high-resolution optical profiler for accurate surface profiling measurements. SLOAN DEKTAK V-200 SL enables fast analysis of a wide range of samples with wide dynamic range characterization, high throughput, and versatile mapping capabilities. Additionally, its customizable modes and parameters offer maximum flexibility and allow users to set up tests quickly and easily. SLOAN V200-SL's advanced wafer testing and metrology capabilities include image correlation analysis, material contrast and photoluminescence imaging, surface roughness and defect inspection, and various other analysis and characterization techniques. Its comprehensive software suite enables users to analyze data quickly, and automate data collection and analysis. V200-SL also features a range of options to expand its capabilities. It supports up to two chamber switches, enabling rapid transfer of samples between various test and measurement modules. It also supports multiple sample stages and various interchangeable objective lenses for high-speed scanning and imaging. Overall, VEECO / SLOAN DEKTAK V-200 SL is a reliable, cost-efficient wafer testing and metrology system that offers comprehensive and precise analysis for materials such as gallium nitride, carbon nanotubes, semiconductors, and optoelectronic wafers. Its high-resolution imaging scanner, optical profiler, image correlation analysis, and customizable modes and parameters make it a powerful tool for characterizing a range of materials with accuracy and precision.