Used VEECO / SLOAN V200-SL #9266835 for sale

VEECO / SLOAN V200-SL wafer testing and metrology equipment, manufactured by VEECO, is a sophisticated, high-precision instrument designed to provide top-of-the-line accuracy when testing and measuring the electrical properties of semiconductor wafers. This system is built on an ergonomic mechanical design and is powered by precise, high-speed 30 kV electron optics for consistent, reliable imaging and measurements. With its sophisticated pulse control that ensures accuracy to within a nanometer, it is capable of dynamical temporal measurement even at the highest resolution. Additionally, it features a dynamic, automated sample stage to easily manage various applications and a customized operator interface. The unit offers intuitive parameter-based software for straightforward operation and small-spot scan measurement capabilities. It also provides comprehensive in-situ electrical analysis, including transconductance-voltage (G-V) curves, gate leakage current, device transmissivity, dynamic dielectric constant, and I-V curves. For precise, reliable testing and metrology, the machine is equipped with an advanced microscope with a 10µm resolution. Additionally, it features a large number of features designed to improve accuracy and analysis, including beam current compensation, automated defect analysis, automated threshold setting, and a programmable wafer stage. The tool is available in two separate configurations, one with a single chamber and one with two chambers. The single chamber variant includes a 76mm wafer stage and the two-chamber version includes a 150mm wafer stage. Each chamber has its own integrated static metrology and dynamic electrical measurement systems. VEECO V200-SL wafer testing and metrology asset from SLOAN is an all-encompassing instrument designed to provide advanced measurement accuracy and reliability. It's intuitive operation and comprehensive in-situ electrical analysis make it the perfect choice for high-precision semiconductor testing and metrology.