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Marketplace
Scanning Electron Microscopes
ZEISS
Auriga 40
Used ZEISS Auriga 40 for sale
Scanning Electron Microscopes
Manufacturer
ZEISS
Model
Auriga 40
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ZEISS
Auriga 40
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Single GIS Charge Compensator Plasma Cleaner
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