Used JEOL JEM 2000FX #9239696 for sale

JEOL JEM 2000FX is a scanning electron microscope (SEM) that is designed for advanced imaging and analysis of nanoscale structures. It boasts a high-resolution detector, variable pressure operation, and a wide range of specimen-mounting options. JEM 2000FX features a high-resolution detector of 3.5 megapixels that is capable of producing work sample images with a resolution of 0.6 nanometer. This allows for detailed imaging and analysis on small nanoscale objects. Additionally, the detector can detect secondary electrons, reflected electrons and transmitted electrons. This multi-beam system is designed to make image acquisition and processing easier and faster than ever before. JEOL JEM 2000FX is capable of operating in both variable-pressure and high-vacuum modes. By varying the pressure inside the microscope's chamber, the interaction between the incident beam of electrons and the specimen can be controlled, allowing for better resolution. Additionally, thanks to the additional secondary neutralization capability, the imaging process can be improved as well. JEM 2000FX also offers a wide range of specimen-mounting options, including cryo-SEM, rotating disk, and preparation stages. These features allow for the efficient imaging and analysis of various samples, such as biological specimens or microstructures. Finally, the microscope comes with an array of advanced software options, such as 3D tomography, spectral analysis, or particle-size measurement, allowing researchers to quickly and accurately analyze and process their work samples. In conclusion, JEOL JEM 2000FX is a state-of-the-art scanning electron microscope designed for advanced imaging and analysis on nanoscale samples. It is capable of producing high-resolution images and offers multiple options for specimen-mounting and software analysis, making it an ideal choice for anyone in the field of nanoscale research.