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Wafer Testing And Metrology
CYBEROPTICS
EX-43Q
Used CYBEROPTICS EX-43Q for sale
Wafer Testing And Metrology
Manufacturer
CYBEROPTICS
Model
EX-43Q
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CYBEROPTICS
EX-43Q
Wafer mapping sensor Dual wide beam Optimum detecting distance: 1.5" Maximum detecting range: 1.4"
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