Used JEOL JSM 6700F #9244394 for sale

JEOL JSM 6700F is a scanning electron microscope (SEM) designed for high performance imaging in a wide range of applications. This SEM is equipped with an advanced field emission gun, which is capable of delivering high quality images with resolution as fine as 1 nm. This instrument is designed with an electron-gun assembly that incorporates enhanced focusing and alignment capabilities to produce the most accurate images of samples. The instrument is equipped with a liquid nitrogen cooled cryo-equipment, which enables research on biological samples that need to be cooled to low temperatures. It comes with an integrated laser interferometer that can measure the accuracy of the stage movement and reduce the measurement errors. The instrument uses Field Embedded Autotrigger system that captures high resolution images. It features an advanced sample preparation unit that can both heat and cool samples, enabling researchers to study the effect of temperature on sample structures. JEOL JSM 6700 F has a high dynamic range detector, which produces high contrast images with low noise levels. To further improve the resolution of images, users can explore the possibility of using an Electron-Beam Charge Compensation (EBCC) machine, a device that controls electrons in the electron beam for improved contrast. The advanced software installed with the instrument is capable of advanced navigating, stage control and automatic feature recognition. The software also comes with particle identification and sorting, enabling users to study minute details from the images. The SEM comes with an advanced 3D dataset stack reconstruction tool, which allows researchers to create 3D reconstructions from 2D images from the SEM. This tool helps in the creation of 3D illustrations of the sample structures. Overall, JSM 6700F is an excellent scanning electron microscope for a variety of research needs. By combining advanced hardware and software features, the instrument can produce high quality images with excellent resolution, enabling researchers to study samples in detail.