Used ZEISS Surfcom 1500SD #9244664 for sale

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ID: 9244664
Surface profiler.
ZEISS Surfcom 1500SD is an advanced metrology and wafer testing equipment developed by ZEISS Corporation. The system provides a powerful solution for complex non-contact surface metrology, and wafer testing. It performs a variety of tasks including precise 3D surface measurements, determination of material properties, thermal performance testing, and topography measurements. Surfcom 1500SD is an automated unit that is controlled by a programmable logic controller (PLC). This PLC allows users to develop, modify, and store custom programs tailored to their specific metrology and wafer testing needs. This advanced machine utilizes one or two automated stages, depending on the specific model, and a high precision Z-axis. The Z-axis is used to move the sample in a controlled manner along the X,Y,Z axes in order to perform the desired measurements. ZEISS Surfcom 1500SD utilizes a variety of probes and detectors to measure and analyze surfaces in high-resolution. These probes are capable of accurately measuring a range of parameters including height, radius, pitch, and angle. Additionally, the tool is equipped with a 3-axis accelerometer to detect vibrations and other environmental conditions that may affect the accuracy of measurements. Surfcom 1500SD software features an intuitive graphical user interface (GUI) for controlling the asset, and for setting measurments. This software provides a simple and easy workflow for the metrology and wafer testing process, with specific data visualization tools for easy data understanding and analysis. ZEISS Surfcom 1500SD is capable of connecting to a range of peripheral components that assist in the sample alignment and testing as well as providing for automatic sample loading and unloading. As an additional benefit the model is capable of storing data through its internal storage and can access the cloud for automated data uploads and storage. Overall, Surfcom 1500SD is a powerful and versatile tool for performing advanced metrology and wafer testing. Its advanced features and automated measurements capability make it an ideal solution for a wide range of testing applications.
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