Used JEOL JEM 2010 for sale

Scanning Electron Microscopes

Manufacturer

JEOL

Model

JEM 2010

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Transmission Electron Microscope (TEM) Accelerating voltage: 200 kV Point resolution: 0.19 nm Equipp

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Transmission Electron Microscope (TEM) Thermal cathode (Tungsten, Denka LaB6) Cold trap Camera side

100

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Transmission Electron Microscope (TEM) Hard Disk Drive (HDD) has been removed.

204

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Transmission Electron Microscope (TEM) LaB6 Source Analytical pole piece: 0.23 nm STEM Detector No c

301

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Transmission electron microscope (TEM) Operation console (Left / Right): Image control panel Monito

252

Transmission Electron Microscope (TEM) Non-functional.

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Transmission Electron Microscope (TEM).