Used RUDOLPH Metapulse 200X-Cu for sale

Wafer Testing And Metrology

Manufacturer

RUDOLPH

Model

Metapulse 200X-Cu

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Thin film thickness metrology system, 8" Does not include laser 2001 vintage.

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Thin film measurement system, 8" 2001 vintage.

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Thin film thickness metrology system, 8" System type: SMIF Cu Measurement Illumination (Diode pumpe

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Film thickness measurement system 2001 vintage.

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Film thickness measurement system 2003 vintage.

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Film thickness measurement system, 6".