Used TEL / TOKYO ELECTRON P-8 #9407565 for sale

TEL / TOKYO ELECTRON P-8 is a state-of-the-art prober developed by TEL/Toshiba for testing semiconductor devices. TEL P8 is equipped with an 8" Wafer Mapper, High Resolution Z-Axis Motion, and an 8-Axis High Speed Wafer Stage. Its Wafer Mapper has a maximum resolution of 0.5μm pitch and the High Resolution Z-Axis Motion (X, Y, and Z motion range) is capable of up to 4μm. Its 8-Axis High Speed Wafer Staage uses a positional accuracy of 0.05μm/Axis and a 30μm/sec sample speed, as well as a 0.5μm/sec wafer handling speed. TOKYO ELECTRON P 8 also features an Automatic Lifetime and Spacer Compensation equipment, which enables the accurate and repeatable positioning of the probe head with respect to the device under test. This system includes a Touch Off Unit for non-contact positioning and a Tester Alignment Machine for fine tuning of the probe head position. Additionally, P-8 boasts a highly reliable, stress-free tool for device protection, providing protection from from ESD, contamination, and vibration. TOKYO ELECTRON P8 also has a powerful, antistatic asset that provides an efficient way of controlling charge decay, resulting in superior measurement repeatability, device stability, and testing maintenance. The model also includes a non-contact capacitive eddy current sensor for charge transfer and pulsed current injection for the suppression of charge buildup. TEL / TOKYO ELECTRON P8 is a perfect all-in-one solution for challenging semiconductor product testing. Its combination of appearance, detection, positioning accuracy, protection features, and anti-static control systems make it the ideal tool for manufacturing and testing of semiconductor wafer and packaged devices. TEL P 8 allows for efficient testing, with minimized defects, faster results, and superior device lifespan.