Used KLA / TENCOR Alpha Step 200 #9065947 for sale
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KLA / TENCOR Alpha Step 200 is a state of the art wafer testing and metrology equipment. This system offers a uniquely comprehensive combination of capabilities with a single tool. It offers wafer testing, measurement and analysis and measurements of film thickness, surface topography and electrical properties. KLA ALPHASTEP 200 has a CCD imaging unit that is designed to provide both bright field and dark field imaging capabilities. This enables the machine to capture detailed images of different types of samples, enabling more accurate measurement. The tool also offers automated stage handling capabilities and 6DOF (6 degree of freedom) robotic stage movements for optimal sample preparation and measurement. TENCOR ALPHA-STEP 200 also features integrated control and data acquisition software, which helps simplify programming and data analysis tasks. This asset is designed to meet the needs of a variety of different applications, including photomask inspection, review of circuit layout and thin-film metrology. The model can be used for on-line metrology testing, in-line production decisions and characterization of process variables. TheAlpha Step 200 is equipped with a high-precision interferometer for 2D/3D scanning and measurement. The interferometer features a unique air plenum design, which helps reduce measurement errors caused by air currents. The equipment also offers an advanced data analysis system, which makes it possible to analyze data with a high degree of accuracy. KLA / TENCOR ALPHASTEP 200 has a wide range of other features designed to make it a versatile and efficient testing and measurement unit. It features an integrated stage drive machine for fast and accurate testing of samples, as well as a multiple sample stage configuration for processing multiple wafers simultaneously. It also offers an automated vacuum tool for accurate sample preparation and a built-in thermal chamber for temperature-sensitive measurements. Additionally, TENCOR ALPHASTEP 200 has a built-in motion control asset that enables automated testing and data collection of samples. This model is designed to enable high throughput, accuracy and reliable data collection. In addition, the equipment has integrated software packages that are designed to enable more detailed measurements, such as defect sizing and identification. In short, TENCOR Alpha Step 200 is a powerful wafer testing and metrology system. It offers a wide range of features designed to make it an effective solution for a variety of applications, including photomask inspection, review of circuit layouts and thin-film metrology. This unit provides real-time data acquisition, integrated software packages and high accuracy, making it an ideal choice for any environment where accurate measurements and analysis are essential.
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