Used ADE / KLA / TENCOR AFS 3220 #293586543 for sale

ADE / KLA / TENCOR AFS 3220 is a leading wafer testing and metrology equipment used to observe and analyze particle-level features on the surface of wafers and other semiconductor materials. It is important to understand the fine details of a semiconductor product's surface features because they define its performance and ultimately, the quality of the device. ADE AFS 3220 offers a precise and comprehensive 3D surface metrology solution that can measure features over a large area, including particles, markings, structural and geometrical features, and unusual shapes. Using scan and topography technologies, it can measure the surface evenness, width, height, and radius of curvature of these features. KLA AFS 3220 offers two main scanning modes that make it an ideal tool for wafer testing and metrology. The first scanning mode is line scanning which is used for fast measurements over a large area. This mode captures the raw shape and surface topography data very quickly. The second scanning mode is area scanning which captures higher resolution data in higher detail. This mode can be used for detailed analysis of particle surface features. The system is equipped with a high-resolution imaging sensor, laser precision scanning stage, and automated algorithms for accurate and reliable imaging. It also includes a high-accuracy Z-range positioning unit that allows for a wider range of field-of-view and a great range of surface features. A key feature of AFS 3220 is its automated imaging process that eliminates manual imaging steps, ensuring that the results will be repeatable and reproducible. It also provides an intuitive user interface which helps minimize training time, allowing users to quickly get up-and-running without considerable instruction. Overall, TENCOR AFS 3220 is a reliable and user-friendly machine that allows a user to capture, analyze and report on a wide range of particle-level surface features of a semiconductor product with accuracy. It is an indispensable tool for those who need efficient and accurate assessment of wafer testing and metrology.