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96 RESULTS FOUND FOR: used Ellipsometers

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  • ANGSTROM SUN TECHNOLOGIES: SE200BMC

    ANGSTROM SUN TECHNOLOGIES SE200BMC Probe spectroscopic ellipsometer Wavelength range: 250-1000 mm Incidence angle range: 10-90 degrees at 5 degree interval Incident angle change: 5 manual Measurement time: 1-3 s whole spectra Beam size: 1 to 5 mm adjustable Measurement type: film thickness, optical constants Measurable thickness range: up to 30 um Data acquisition: automatic Operation modes: engineer mode and operator mode Light source: 75W xenon lamp arc light source NK database: over 300 NK table included Control: Intel dual core processor and 19" LCD monitor Software advanced TFprobe 3.3 for simulation.
  • DNS / DAINIPPON: RE-5200

    DAINIPPON RE-5200 Spectroscopic ellipsometer Standard configuration Capable of measuring a curve 2008 vintage.
  • GAERTNER: L116D

    GAERTNER L116D Ellipsometer 1997 vintage.
  • GAERTNER: L115 A

    GAERTNER L115 A Ellipsometer 1983 vintage.
  • GAERTNER: L106C

    GAERTNER L106C Large substrate ellipsometer Manual load Stage: 15" diameter circle, rotates 360° Radial sliding scale: Graduated in 0.1 cm increments Total stage travel: 19.8 cm Variable angle model Includes PC Used for measuring coatings on 14" diameter glass disks.
  • HORIBA / JOBIN YVON: UVISEL

    HORIBA / JOBIN YVON Uvisel Spectroscopic phase modulated Ellipsometer, 8" With 200-800nm range, Xenon light source with fiber optic delivery, polarizer, and photoelastic modulator, MECS UTC-200R transfer robot handles up to 200mm wafers, includes software and Manuals 1997 vintage.
  • HORIBA / JOBIN YVON: UVISEL

    HORIBA / JOBIN YVON UVISEL Spectroscopic ellipsometer.
  • HORIBA / JOBIN YVON: PZ2000

    HORIBA / JOBIN YVON PZ2000 Ellipsometer, 6" Chuck size: 8" RI Test: 1250A Wafer reads: 2.015 OS: Windows 2000.
  • HORIBA / JOBIN YVON: UVISEL II

    HORIBA / JOBIN YVON UVISEL II Spectroscopic ellipsometer.
  • J.A. WOOLHAM: M-44

    JA WOOLHAM M44 Ellipsometer.
  • J.A. WOOLHAM: M-44

    JA WOOLHAM M44 Ellipsometer.
  • J.A. WOOLHAM: M-44

    JA WOOLHAM M44 Ellipsometer.
  • J.A. WOOLLAM: H-VASE

    J.A. WOOLLAM H-VASE Ellipsometer 1998 vintage. J.A. WOOLLAM H-VASE
  • J.A. WOOLLAM: M-2000

    J.A. WOOLLAM M-2000 Ellipsometer EC-400 Controller Focused M-2000 Model: X (500) Wavelengths: 193-1000nm Multiple incident angles of 45/60/75 degrees (3mm x 4.5mm Spot) Incident angle with microspot lens: 60 degree (25x50 Micron spot size) XENON FLS-350 75W Source Power module: EPM-222 WATEC WAT-902H2 Video camera Fixed angle base with rotating compensator Motorized stage: Tip / Tilt XY Mapping stage: 200mm x 200mm PC With Windows 7 enterprise OS 2005 vintage.
  • J.A. WOOLLAM: M-2000

    J.A. WOOLLAM M-2000 Ellipsometer EC-400 Controller Fixed angle Focused M-2000 Model: X Mapping stage.
  • J.A. WOOLLAM: M-2000

    J.A. WOOLLAM M-2000 Ellipsometer EC-400 Controller Fixed angle Focused M-2000 Model: X Mapping stage.
  • J.A. WOOLLAM: M-2000

    J.A. WOOLLAM M-2000 Ellipsometer EC-400 Controller Focused M-2000 Model: X (500) Wavelengths: 193-1000nm Multiple incident angles of 45/60/75 degrees (3mm x 4.5mm Spot) Incident angle with microspot lens: 60 degree (25x50 Micron spot size) XENON FLS-350 75W Source Power module: EPM-222 WATEC WAT-902H2 Video camera Fixed angle base with rotating compensator Motorized stage: Tip / Tilt XY Mapping stage: 200mm x 200mm PC With Windows 7 enterprise OS 2005 vintage.
  • J.A. WOOLLAM: M-2000

    J.A. WOOLLAM M-2000 Ellipsometer, 8" PMT Included NIR Upgraded Auto angle system Tilt and tip Mapping upgrade Operating system: Windows.
  • J.A. WOOLLAM: M-2000

    J.A. WOOLLAM M-2000 Ellipsometer EC-400 Controller Focused M-2000 Model: X (500) Wavelengths: 193-1000nm Multiple incident angles of 45/60/75 degrees (3mm x 4.5mm Spot) Incident angle with microspot lens: 60 degree (25x50 Micron spot size) XENON FLS-350 75W Source Power module: EPM-222 WATEC WAT-902H2 Video camera Fixed angle base with rotating compensator Motorized stage: Tip / Tilt XY Mapping stage: 200mm x 200mm PC With Windows 7 enterprise OS 2005 vintage.
  • J.A. WOOLLAM: M-2000D

    J.A. WOOLLAM M-2000D Rotating compensator ellipsometer With high-speed CCD detection 193-1000nm, 500 wavelengths Includes: INSTEC HTC-200 heat cell ES-130 Base BASE-ESB-131-51 EASE Software INSTEC LN2-P2A INSTEC HCP621V-STC20A UN1977 Nitrogen holder.
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