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396 RESULTS FOUND FOR: used Ellipsometers

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  • ANGSTROM SUN TECHNOLOGIES: SE200BMC

    ANGSTROM SUN TECHNOLOGIES SE200BMC Probe spectroscopic ellipsometer Wavelength range: 250-1000 mm Incidence angle range: 10-90 degrees at 5 degree interval Incident angle change: 5 manual Measurement time: 1-3 s whole spectra Beam size: 1 to 5 mm adjustable Measurement type: film thickness, optical constants Measurable thickness range: up to 30 um Data acquisition: automatic Operation modes: engineer mode and operator mode Light source: 75W xenon lamp arc light source NK database: over 300 NK table included Control: Intel dual core processor and 19" LCD monitor Software advanced TFprobe 3.3 for simulation.
  • DNS / DAINIPPON: RE-5200

    DAINIPPON RE-5200 Spectroscopic ellipsometer Standard configuration Capable of measuring a curve 2008 vintage.
  • GAERTNER: L106C

    GAERTNER L106C Large substrate ellipsometer.
  • GAERTNER: L117

    GAERTNER L117 Ellipsometer.
  • GAERTNER: LSE

    GAERTNER LSE GAERTNER LSE Ellipsometer, 2005 vintage.
  • GAERTNER: L116 C

    GAERTNER L116 C Ellipsometer Includes: Main ellipsometer system Computer (PC Tower, PS2 keyboard, PS2 mouse, monitor) Software All associated cards Cables Manuals Warehoused.
  • GAERTNER: L116

    GAERTNER L116 Ellipsometer, manually operated.
  • GAERTNER: LSE-WS

    GAERTNER: LSE-WS Stokes WAFERSKAN ellipsometer, up to 12" Calibrated in 2007 Light Source: Melles Griot 6328 A HeNe Laser Electrical: Supplied through computer interface HeNe laser power supply: 100v, 115v, 230v, 50/60 Hz Beam Diameter: 1 mm PC Interface included with LGEMP 4 layer absorbing program Windows 95/98 with VGA monitor Incidence angle: 70 degrees Refractive Index: +/- 0.002 over most of measurement range Measurement time: Practically instantaneous Precision and Repeatability: +/- 1 Angstrom over Most of measurement range Film Thickness Range: 0-60,000 Angstrom on substrates or on 1,2,3, or 4 known sub-layers 2002 vintage.
  • GAERTNER: L117-C

    GAERTNER L117-C Ellipsometer Oriel 70705 high voltage supply Spex 1681B 0.22m spectrometer Spex 1683P and 1682A broadband radiation source (Tungsten, Deuterium) National Instruments SCB-68 Gaertner L117C (mechanical part) Monochromator Photomultiplier Halogen lamp May include Win 98 software Cables.
  • GAERTNER: L116S

    GAERTNER: L116S Variable angle ellipsometer with Stokes detector, 8" Single wavelength 633nm He laser Film thickness range: 60kA 8" Wafer stage with manual X/Y and rotation Interface cable Software Measures most single layer thin film nitrides, oxides, and photoresists with single Angstrom precision as well as thick film polyimides and photoresists 2001 vintage.
  • GAERTNER: L116 C

    GAERTNER L116 C Ellipsometer.
  • GAERTNER: L116 C

    GAERTNER L116 C Ellipsometer.
  • GAERTNER: L2W16E.1550

    GAERTNER L2W16E.1550 Ellipsometer, 8".
  • GAERTNER: L116 C

    GAERTNER L116 C Ellipsometer Includes: Main ellipsometer system Computer (PC Tower, PS2 keyboard, PS2 mouse, monitor) Software All associated cards Cables Manuals Warehoused.
  • GAERTNER: L115S-8

    GAERTNER L115S-8 Variable angle Stokes ellipsometer Waferscan high speed mapping capability Measures 49 sites in 49 seconds 2D/3D color thickness and index maps Single layer oxides, nitrides, photoresist film thickness range: 0 to 60k Angstroms with 1A precision 8" Wafer stage KLINGER CC1.2 X/Y stage controller Laser installed in 1996 1994 vintage.
  • GAERTNER: L116 C

    GAERTNER L116 C Ellipsometer Includes: Main ellipsometer system Computer (PC Tower, PS2 keyboard, PS2 mouse, monitor) Software All associated cards Cables Manuals Warehoused.
  • GAERTNER: L115S-8

    GAERTNER: L115S-8 Variable angle Stokes ellipsometer Waferscan high speed mapping capability Measures 49 sites in 49 seconds 2D/3D color thickness and index maps Single layer oxides, nitrides, photoresist film thickness range: 0 to 60k Angstroms with 1A precision 8" Wafer stage KLINGER CC1.2 X/Y stage controller Laser installed in 1996 1994 vintage.
  • GAERTNER: L116S

    GAERTNER: L116S Variable angle ellipsometer with Stokes detector, 8" Single wavelength 633nm He laser Film thickness range: 60kA 8" Wafer stage with manual X/Y and rotation Interface cable Software Measures most single layer thin film nitrides, oxides, and photoresists with single Angstrom precision as well as thick film polyimides and photoresists 2001 vintage.
  • GAERTNER: L116S

    GAERTNER L116S Variable angle ellipsometer with Stokes detector, 8" Single wavelength 633nm He laser Film thickness range: 60kA 8" Wafer stage with manual X/Y and rotation Interface cable Software Measures most single layer thin film nitrides, oxides, and photoresists with single Angstrom precision as well as thick film polyimides and photoresists 2001 vintage.
  • GAERTNER: LSE

    GAERTNER LSE Ellipsometer, 2005 vintage.
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