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4580 RESULTS FOUND FOR: used Scanning Electron Microscopes

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    ZEISS Merlin Scanning electron microscope Secondary electrons: 1.0 nm at 15 kV 1.8 nm at 1 kV 3.0 nm at 200 V Acceleration voltage range: 20 V to 30000 V Magnification: 12x to 2000000x without using overview modes Overview mode: 1x to 20x Operating currents: 10 pA to 20 nA Optimum analytical working distance: 8.5 mm Energy dispersive spectrometer within 8.5 - 20 mm Vacuum system: Oil-free Low vacuum mode with variable pressure range of 10-133 Pa Auto-alignment system with built-in anti-vibration platform Working table with motorization on 5 axes X Axis :130 mm Y Axis: 130 mm Z Axis: 50 mm Continuous rotation: Up to 360 gr Slope range: - 3 gr - + 70 gr Accuracy movement not worse than 1 μm Table type: Combined eucentric Table control: Double joystick Remote panel 1: Trackballs & Function buttons integrated with computer keyboard Remote panel 2: Maximum dimensions: Diameter: up to 200 mm Thickness: up to 80 mm Computer control unit: Intel core 2 duo Operating system: Windows Part number Description 349520-9031-000 20nA High resolution configuration for VP systems GEMINI I 347823-9056-000 Operating system Windows with keyboard 346023-9011-140 Control panel with rotary controls and keyboard 349506-9003-000 Pneumatic retractable multi-mode STEM-detector, with 12x sample holder for BF & DF detection 347805-8027-000 Stem MP-port 2 adapter 66 mm for SUPRA 55/55VP & ULTRA 55 / ULTRA Plus & Merlin 348242-8146-000 Multiple single stub holder 4 x 3 348242-8142-000 Multi-purpose sample holder 348242-8075-000 Large multi-purpose sample holder 348342-8055-000 Faraday cup. Stub with integrated hole-aperture to measure the probe current 348242-0026-000 Dovetail basic unit for customer's own sample holders 348224-6062-000 Dual channel operation 348224-6003-000 Dual magnification 348224-6013-000 Image maths 348224-6030-000 Compucentric stage 348224-6029-000 Stage registration 348224-6007-000 Stage scan pattern 348224-6014-000 RS 232 Remote control 348224-6058-000 Drift correction 498-237 USB Dongle for drift correction 348224-6080-000 Fish-eye mode 347823-9117-100 X-ray & external scan input panel kit C/w REMCON 346033-9220-000 ACD4 Board 346023-8012-000 Additional 24" flat panel TFT colour display monitor 346000-8026-010 Quiet mode 345596-0000-000 Compressor 345980-9023-000 Chiller aircooled 354752-9836-000 Specimen preparation kit. ZEISS Merlin FEG Scanning electron microscope (SEM), 2013 vintage.
  • AMAT / APPLIED MATERIALS: VERITYSEM 4I

    APPLIED MATERIALS: VeritySem 4i CD SEM, 12" Dry Pump: MU100X (KASHIYAMA) 2011 vintage.
  • AMAT / APPLIED MATERIALS: VERITY+ II

    APPLIED MATERIALS Verity+ II CD SEM, 12" 3 Pots.
  • AMAT / APPLIED MATERIALS: VERITYSEM 3

    APPLIED MATERIALS VeritySEM 3 CD SEM, 8" and 12" Install type: stand-alone Cassette interface: (3) TDK FOUP load ports Status lamp (R, Y, G, audible) System software: ver 14.3.2.P1 User interface: User station Computer Flat panel monitor Keyboard/Mouse Power requirements: 208 VAC, 3 phase 2006 vintage.
  • AMAT / APPLIED MATERIALS: OPAL 7830

    APPLIED MATERIALS / OPAL 7830i APPLIED MATERIALS / OPAL 7830i Scanning electron microscope, parts machine.
  • AMAT / APPLIED MATERIALS: VERASEM 3D

    APPLIED MATERIALS VeraSEM 3D Scanning electron microscope (SEM), 8" HEPA system: not included 2001 vintage.
  • AMAT / APPLIED MATERIALS: VERITY

    APPLIED MATERIALS Verity Review SEM, 12" 2005 vintage.
  • AMAT / APPLIED MATERIALS: VERITYSEM 2

    APPLIED MATERIALS VeritySEM 2 Critical dimension (CD) measurement system.
  • AMAT / APPLIED MATERIALS: VERITYSEM 2

    APPLIED MATERIALS VeritySEM 2 Critical dimension (CD) measurement system, 12" Software version: 14.3.2.P1 Loader configuration: (3) Loaders System power rating: 208V AC, 3phase Can be inspected Currently installed 2006 vintage.
  • AMAT / APPLIED MATERIALS: G6 450

    APPLIED MATERIALS G6 450 Defect review scanning electron microscope 2013 vintage.
  • AMAT / APPLIED MATERIALS: VERITY

    APPLIED MATERIALS Verity Scanning electron microscope (SEM) CDSEM (BEOL) With FIB.
  • AMAT / APPLIED MATERIALS: NANOSEM 3D

    APPLIED MATERIALS NanoSem 3D CD SEM metrology system Set up to inspect 6"X6"X.25" reticles Specifications: Optical Microscope Lens Standing Operator Console Host Communication SECSII-GEM/HSMS System Options include 3D Metrology, Contac Hole Profile Grade, and Defect Review Application NANO3D Manuals Retrofit for Reticle Capability Automated Ports -Automatic Reticle Pod Handler Platform Type - Reticle DC System Wafer Shape - Reticle Shape Square 2002 vintage.
  • AMAT / APPLIED MATERIALS: VERASEM

    APPLIED MATERIALS VeraSem CD-SEM systems.
  • AMAT / APPLIED MATERIALS: VERITYSEM 3

    APPLIED MATERIALS VeritySEM 3 Critical dimension (CD) measurement system, 12" Software version: 14.3.2 Loader configuration: (3) Loaders System power rating: 120 VAC, 3 Phase Can be inspected Currently installed 2007 vintage.
  • AMAT / APPLIED MATERIALS: VERASEM

    APPLIED MATERIALS VeraSem CD-Scanning electron microscope (SEM), 12" 2002 vintage.
  • AMAT / APPLIED MATERIALS: SEMVISION CX

    APPLIED MATERIALS SemVision CX Scanning electron microscope, 8".
  • AMAT / APPLIED MATERIALS: VERITYSEM

    APPLIED MATERIALS VeritySEM CD SEM, 8" and 12" (1) 12" FOUP Loader (2) 8" SMIF Loaders Dry pumps: (1) Edwards IQDP80, (1) Edwards IQDP40 Controller Electrical box 2004 vintage.
  • AMAT / APPLIED MATERIALS: VERASEM

    APPLIED MATERIALS VeraSEM System, 12".
  • AMAT / APPLIED MATERIALS: VERITYSEM

    APPLIED MATERIALS VeritySEM Scanning electron Microscope (SEM), 8" Process: Metrology AC power rack and pumps not included 2005 vintage.
  • AMAT / APPLIED MATERIALS: VERITYSEM

    APPLIED MATERIALS VeritySEM Scanning electron microscope (SEM), 8" Process: Metrology Dry pump : EBARA ESR20N 2EA Missing part: AC Power rack 2005 vintage.
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